Welcome to Fischer Instrumentation (GB) Ltd -
a website dedicated to X-ray analysis of materials and coating thickness measurement
The Helmut Fischer Group brings a unique approach to X-ray analysis, after a long history of coating thickness measurement and material analysis.
NON-DESTRUCTIVE material analysis has always been paramount to our customers, so our material analysis instruments have:
- Large chambers to accommodate complete assemblies, from populated PCBs to gold plated trophys.
- Selectable X-ray beam sizes, from 50 micro metres for material analysis of small components or PCB tracks, up to milli metres for rapid bulk material analysis to include bulk metal analysis, bulk solutions analysis and bulk powder analysis.
- Focussing mechanisms to allow investigation into bores or recesses.
- Programmable XY stages provide array measurements over an entire assembly or automatic measurements on multiple samples.
- The ability to measure and analyse not just coatings but also underlayers.
Fischer's X-ray expertise lies in 
: Material Analysis, RoHS/WEEE compliance, High Reliability > 3% Pb Content Solders, Counterfeit Component Identification, Obsolescent Component Replacement, Precious Metal Assay, Coating Thickness Measurement.
NEWS:See Fischer Instrumentation on Stand R48 at the Southern Manufacturing Exhibition, FIVE, Aerospace Boulevard, Farnborough, Hampshire 10th - 11th February 2010, where an innovative, versatile range of instrumentation will be on display.
NEWS: Fischer's non destructive X-ray-fluorescence (XRF) technology helps Birmingham Assay Office adapt to change and emerge as the largest, most successful Assay Office in the world. Read more
NEW RANGE of coating thickness measurement FMP10-40 handhelds utilising PC technology. See the movie clip below:
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Fischer Instrumentation GB have an expanding range of coating thickness measurement hand-helds from budget to the hi-tech graphical interface variety; many of which are now assembled in England...read more
SIMPLE STAND GREATLY IMPROVES MEASUREMENT PRECISION. Read more
RAPID PLATING SOLUTION ANALYSIS USING XRF. Following extensive research, Dr Simone Gill physicist at the Helmut Fischer Group demonstrates the difference between XRF and more traditional methods of analysing plating solutions. Read more
LATEST DEVELOPMENT: New look Feritscope, same super functionality for measuring Ferrite Content in Stainless Steels. Read more
CASE STUDY: Fischer spectrometer pre-scans mineral samples for Diamond Light Source beamline. Read the case study
National Physical Laboratory has X-ray fluorescence under the microscope...read more
Download Paper: The blue reflective silicon solar panels attract more and more attention on our rooftops. In Germany, it is big business. Dr Staib of Helmut Fischer GmbH gives a detailed account of how x-ray instrumentation is perfectly suited to the analysis requirements of manufacturers...read more
Unusual material analysis case study: How metal analysis methods and archaeology can work together to uncover deeper and richer findings...read more under Case Studies in Archive